TrustSeal Verified
SURFCOM TOUCH 50 system come with an intuitive and easy-to-use screen for condition setting, calibration, measurement and analysis. An amplifier with a 7-inch wide touch panel and a new interface provides higher operability. Easy-to-use operation eliminates the need of instructions. The high performance pickup with an extended measurement range from 800 to 1,000 μm and a Z-axis minimum resolution of 0.0001 μm allows for wide-range and high resolution skidless measurement. In addition to a flat surface, the roughness or waviness on an undulating surface such as a stepped or round surface can be evaluated with one trace.
SURFCOM TOUCH 50 has skid less measurement with a high-performance pickup while having high resolution and with a wide measuring range. Various types of workpieces can be measured by changing the stylus for deep, long, or small holes or a round surface.
Z direction ±500 μm
X direction 50 mm
Evaluation Length 0.1 to 50 mm
Straightness accuracy 0.3 μm/50 mm
Detector vertical movement volume 50 mm
Measurement Speed 0.15, 0.3, 0.6, 1.5, 3 / 0.05, 0.1, 0.2, 0.5, 1 mm/s (Switching)
Pickup Sensing type Differential inductance
Measurement Method Skid less/Skid (optional)
Z direction resolution 0.0001 μm/±40 μm, 0.00125 μm/±500 μm
Measurement force 0.75 mN
Stylus Radius rtip = 2 μm
Stylus Angle 60°cone
Stylus Material Diamond
Calculation Standards Comply with JIS2013/2001, JIS1994, JIS1982, ISO1997/2009, ISO13565, DIN1990, ASME2002/2009, ASME1995, CNOMO
Parameter - Profile Curve Pa, Pq, Pp, Pv, Pc, PSm, PΔq, PPc, Psk, Pku, Pt, Pmr(c), Pmr, Pδc, Rz82, TILTA, AVH, Hmax, Hmin, AREA, Rmax, Rz, Sm, Δa, Δq, λa, λq, Lr, Rsk, Rku, Rk, Rpk, Rvk, Mr1, Mr2, Vo, K, tp, tp2, Hp
Parameter - Roughness Curve Ra, Rq, Rz, Rv, Rc, Rt, RSm, RΔq, Rsk, Rku, Rmr(c), Rmr, Rδc, Rz94, R3z, RΔa, Rλa, Rλq, Ry, Lr, Sm, S, tp, tp2, PC, RPc JIS, RPc ISO, RPc EN, Pc, PPI, Rp, Rmax, Rz.I, RS, Rmr2, Mr1, Mr2, Rpk, Rvk, Rk, Vo, K, A1, A2, Rpm, Δa, Δq, Htp
Parameter - Waviness Profile Curve Wa, Wq, Wt, Wp, Wv, WSm, WPc, Wsk, Wmr(c), Wmr, Wδc, Wz, Wc, Wku, WΔq, WEM, WEA, WE-a, WE-q, WE-p, WE-v, WE-Sm, WEC-q, WEC-m, WEC-p, WEC-v, WEC-Sm
Parameter - Motif R, Rx, AR, W, Wx, AW, Rke, Rpke, Rvke, NCRX, NR, CPM, SR, SAR, Wte, NW, SAW, SW, Mr1e, Mr2e, Vo, K
Evaluation Curve Profile Curve, Roughness Curve, Filtered Waviness Curve, Waviness Profile Curve, ISO13565 Special Roughness Curve, Roughness motif curve, Waviness motif curve, Upper envelope waviness curve, Rolling Circle Waviness Curve
Characteristics graph Abbot curve, Amplitude density function, Power graph
Filter type Gaussian, 2RC (phase compensation), 2RC (non-phase compensation)
Cutoff value - λc 0.08, 0.25, 0.8, 2.5, 8, 25 mm
Cutoff value - λs None, 2.5, 8, 25 μm
Display 7-inch color liquid crystal touch panel
Data output USB connectors for USB memory, Micro USB connector for USB communication
SURFCOM TOUCH 50 system come with an intuitive and easy-to-use screen for condition setting, calibration, measurement and analysis. An amplifier with a 7-inch wide touch panel and a new interface provides higher operability. Easy-to-use operation eliminates the need of instructions. The high performance pickup with an extended measurement range from 800 to 1,000 μm and a Z-axis minimum resolution of 0.0001 μm allows for wide-range and high resolution skidless measurement. In addition to a flat surface, the roughness or waviness on an undulating surface such as a stepped or round surface can be evaluated with one trace.
SURFCOM TOUCH 50 has skid less measurement with a high-performance pickup while having high resolution and with a wide measuring range. Various types of workpieces can be measured by changing the stylus for deep, long, or small holes or a round surface.
Z direction ±500 μm
X direction 50 mm
Evaluation Length 0.1 to 50 mm
Straightness accuracy 0.3 μm/50 mm
Detector vertical movement volume 50 mm
Measurement Speed 0.15, 0.3, 0.6, 1.5, 3 / 0.05, 0.1, 0.2, 0.5, 1 mm/s (Switching)
Pickup Sensing type Differential inductance
Measurement Method Skid less/Skid (optional)
Z direction resolution 0.0001 μm/±40 μm, 0.00125 μm/±500 μm
Measurement force 0.75 mN
Stylus Radius rtip = 2 μm
Stylus Angle 60°cone
Stylus Material Diamond
Calculation Standards Comply with JIS2013/2001, JIS1994, JIS1982, ISO1997/2009, ISO13565, DIN1990, ASME2002/2009, ASME1995, CNOMO
Parameter - Profile Curve Pa, Pq, Pp, Pv, Pc, PSm, PΔq, PPc, Psk, Pku, Pt, Pmr(c), Pmr, Pδc, Rz82, TILTA, AVH, Hmax, Hmin, AREA, Rmax, Rz, Sm, Δa, Δq, λa, λq, Lr, Rsk, Rku, Rk, Rpk, Rvk, Mr1, Mr2, Vo, K, tp, tp2, Hp
Parameter - Roughness Curve Ra, Rq, Rz, Rv, Rc, Rt, RSm, RΔq, Rsk, Rku, Rmr(c), Rmr, Rδc, Rz94, R3z, RΔa, Rλa, Rλq, Ry, Lr, Sm, S, tp, tp2, PC, RPc JIS, RPc ISO, RPc EN, Pc, PPI, Rp, Rmax, Rz.I, RS, Rmr2, Mr1, Mr2, Rpk, Rvk, Rk, Vo, K, A1, A2, Rpm, Δa, Δq, Htp
Parameter - Waviness Profile Curve Wa, Wq, Wt, Wp, Wv, WSm, WPc, Wsk, Wmr(c), Wmr, Wδc, Wz, Wc, Wku, WΔq, WEM, WEA, WE-a, WE-q, WE-p, WE-v, WE-Sm, WEC-q, WEC-m, WEC-p, WEC-v, WEC-Sm
Parameter - Motif R, Rx, AR, W, Wx, AW, Rke, Rpke, Rvke, NCRX, NR, CPM, SR, SAR, Wte, NW, SAW, SW, Mr1e, Mr2e, Vo, K
Evaluation Curve Profile Curve, Roughness Curve, Filtered Waviness Curve, Waviness Profile Curve, ISO13565 Special Roughness Curve, Roughness motif curve, Waviness motif curve, Upper envelope waviness curve, Rolling Circle Waviness Curve
Characteristics graph Abbot curve, Amplitude density function, Power graph
Filter type Gaussian, 2RC (phase compensation), 2RC (non-phase compensation)
Cutoff value - λc 0.08, 0.25, 0.8, 2.5, 8, 25 mm
Cutoff value - λs None, 2.5, 8, 25 μm
Display 7-inch color liquid crystal touch panel
Data output USB connectors for USB memory, Micro USB connector for USB communication
Key features
Auto Element Judgment (AI Function)
The 1600D automatically determines the type of element (poin tline
circle).
Dimension Display Function
The actual measured values for parameters and geometric deviation
can be displayed on the diagram.
Profile Synthesis Function (merging of several different profiles)
The limitations on the analysis range due to the angle of the stylus
are addressed with the synthesis function.
Peak and Valley Function
This function enables the maximum workpiece point to be detected by
tracing with the stylus, simplifying alignment.
Calculation Point Repeat Function
Overall workpiece analysis can be executed after completing only one
pattern analysis for workpieces where certain shapes are repeated.
Workpiece Trace Function
The measuring range can be determined by tracing the workpiece
once. This is effective for measurement of minute profiles.
Easy Evaluation of Part Contour
Exact data on parts that were previously evaluated with a projector or
tool microscope can be obtained in a short period of time. The
measured results can be used as is for inspection reports.
High Efficiency Measurement
The teaching/playback function automates the entire process, from
measurement to pasting of the data into an inspection report.