QS Metrology Private Limited

HandySurf+ is a simple solution to measure, evaluate and document surface roughness – from incoming goods to production all the way to final inspection. With a sleek design, 2.4 inch color LCD screen, and improved user interface for intuitive operations, HANDYSURF+ offers a simple quality assurance option for measuring surface parameters throughout production. It is an ideal solution for the automotive, mechanical engineering and medical technology industries.

Z direction -210 to +160 µm (370 µm)X direction 16 mmEvaluation Length 0.2 to 16 mmMeasurement Speed 0.5, 0.6, 0.75, 1.0 mm/sPickup Sensing type Differential inductanceMeasurement Method SkidZ direction resolution 0.0007 µm/-210 to +160 µmMeasurement force 4 mNStylus Radius rtip = 5 µmStylus Angle 90°coneStylus Material DiamondCalculation Standards Comply with JIS2013/2001, JIS1994, JIS1982, ISO1997/2009, ISO13565, DIN1990, ASME2002/2009, ASME1995, CNOMOParameter - Profile Curve Pt, Rmax, Rz, Rk, Rpk, Rvk, Mr1, Mr2, Vo, K, tpParameter - Roughness Curve Ra, Rq, Rz, Rv, Rc, Rt, RSm, R?q, Rsk, Rku, Rmr(c), Rmr, Rdc, Rz94, R3z, R?a, Ry, Sm, S, tp, PC, RPc JIS,RPc ISO, RPc EN, Pc, PPI, Rp, Rmax, Mr1, Mr2, Rpk, Rvk, Rk, Vo, K, A1, A2, Rpm, ?a, ?q, HtpParameter - Motif R, Rx, AR, W, Wx, AW, Rke, Rpke, Rvke, NCRX, NR, CPM, SR, SAR, Wte, NW, SAW, SW, Mr1e, Mr2e, Vo, KEvaluation Curve Profile Curve, Roughness Curve, ISO13565Special Roughness Curve, Roughness motif curve, Waviness motif curve, Upper envelope waviness curveCharacteristics graph Bearing area curve, Amplitude distribution curveFilter type Gaussian, 2RC (phase compensation), 2RC (non-phase compensation)Cutoff value - ?c 0.08, 0.25, 0.8, 2.5 mmCutoff value - ?s None, 2.5, 8 µmDisplay 2.4-inch color liquid crystal panelData output USB connectors for USB memory/printer connection x 1, Micro USB connector for USB communication x 1

SURFCOM TOUCH 50 system come with an intuitive and easy-to-use screen for condition setting, calibration, measurement and analysis. An amplifier with a 7-inch wide touch panel and a new interface provides higher operability. Easy-to-use operation eliminates the need of instructions. The high performance pickup with an extended measurement range from 800 to 1,000 μm and a Z-axis minimum resolution of 0.0001 μm allows for wide-range and high resolution skidless measurement. In addition to a flat surface, the roughness or waviness on an undulating surface such as a stepped or round surface can be evaluated with one trace.

 

SURFCOM TOUCH 50 has skid less measurement with a high-performance pickup while having high resolution and with a wide measuring range. Various types of workpieces can be measured by changing the stylus for deep, long, or small holes or a round surface.

Z direction ±500 µmX direction 50 mmEvaluation Length 0.1 to 50 mmStraightness accuracy 0.3 µm/50 mmDetector vertical movement volume 50 mmMeasurement Speed 0.15, 0.3, 0.6, 1.5, 3 / 0.05, 0.1, 0.2, 0.5, 1 mm/s (Switching)Pickup Sensing type Differential inductanceMeasurement Method Skid less/Skid (optional)Z direction resolution 0.0001 µm/±40 µm, 0.00125 µm/±500 µmMeasurement force 0.75 mNStylus Radius rtip = 2 µmStylus Angle 60°coneStylus Material DiamondCalculation Standards Comply with JIS2013/2001, JIS1994, JIS1982, ISO1997/2009, ISO13565, DIN1990, ASME2002/2009, ASME1995, CNOMOParameter - Profile Curve Pa, Pq, Pp, Pv, Pc, PSm, P?q, PPc, Psk, Pku, Pt, Pmr(c), Pmr, Pdc, Rz82, TILTA, AVH, Hmax, Hmin, AREA, Rmax, Rz, Sm, ?a, ?q, ?a, ?q, Lr, Rsk, Rku, Rk, Rpk, Rvk, Mr1, Mr2, Vo, K, tp, tp2, HpParameter - Roughness Curve Ra, Rq, Rz, Rv, Rc, Rt, RSm, R?q, Rsk, Rku, Rmr(c), Rmr, Rdc, Rz94, R3z, R?a, R?a, R?q, Ry, Lr, Sm, S, tp, tp2, PC, RPc JIS, RPc ISO, RPc EN, Pc, PPI, Rp, Rmax, Rz.I, RS, Rmr2, Mr1, Mr2, Rpk, Rvk, Rk, Vo, K, A1, A2, Rpm, ?a, ?q, HtpParameter - Waviness Profile Curve Wa, Wq, Wt, Wp, Wv, WSm, WPc, Wsk, Wmr(c), Wmr, Wdc, Wz, Wc, Wku, W?q, WEM, WEA, WE-a, WE-q, WE-p, WE-v, WE-Sm, WEC-q, WEC-m, WEC-p, WEC-v, WEC-SmParameter - Motif R, Rx, AR, W, Wx, AW, Rke, Rpke, Rvke, NCRX, NR, CPM, SR, SAR, Wte, NW, SAW, SW, Mr1e, Mr2e, Vo, KEvaluation Curve Profile Curve, Roughness Curve, Filtered Waviness Curve, Waviness Profile Curve, ISO13565 Special Roughness Curve, Roughness motif curve, Waviness motif curve, Upper envelope waviness curve, Rolling Circle Waviness CurveCharacteristics graph Abbot curve, Amplitude density function, Power graphFilter type Gaussian, 2RC (phase compensation), 2RC (non-phase compensation)Cutoff value - ?c 0.08, 0.25, 0.8, 2.5, 8, 25 mmCutoff value - ?s None, 2.5, 8, 25 µmDisplay 7-inch color liquid crystal touch panelData output USB connectors for USB memory, Micro USB connector for USB communication

Key features

Auto Element Judgment (AI Function)

The 1600D automatically determines the type of element (poin tline

circle).

Dimension Display Function

The actual measured values for parameters and geometric deviation

can be displayed on the diagram.

Profile Synthesis Function (merging of several different profiles)

The limitations on the analysis range due to the angle of the stylus

are addressed with the synthesis function.

Peak and Valley Function

This function enables the maximum workpiece point to be detected by

tracing with the stylus, simplifying alignment.

Calculation Point Repeat Function

Overall workpiece analysis can be executed after completing only one

pattern analysis for workpieces where certain shapes are repeated.

Workpiece Trace Function

The measuring range can be determined by tracing the workpiece

once. This is effective for measurement of minute profiles.

Easy Evaluation of Part Contour

Exact data on parts that were previously evaluated with a projector or

tool microscope can be obtained in a short period of time. The

measured results can be used as is for inspection reports.

High Efficiency Measurement

The teaching/playback function automates the entire process, from

measurement to pasting of the data into an inspection report.