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Zeiss Surfcom Touch 50 is equipped with a lot of superior features such as best resolution (0.0001 um), large Z axis measuring range of 1000 um, best straightness accuracy in its class, Master specimen having Ra correction and Stylus tip check, 50 mm height adjustment and 50 mm travel and AI function to find out the suitable cut off when cut off is not known or specified.
Zeiss has joined hands with Tokyo Seimetsu of Japan, who are the world leaders in Surface and Form measuring technology, to bring in the best in this field.
HandySurf+ is equipped with a lot of superior features such as best resolution (0.0007 um), latest JIS standards, stylus tip condition check and software as standard scope of supply. More over, pick up of HandySurf + is very sturdy thanks to 60 plus years of experience of TSK in this line.
SURFCOM TOUCH 50 system come with an intuitive and easy-to-use screen for condition setting, calibration, measurement and analysis. An amplifier with a 7-inch wide touch panel and a new interface provides higher operability. Easy-to-use operation eliminates the need of instructions. The high performance pickup with an extended measurement range from 800 to 1,000 μm and a Z-axis minimum resolution of 0.0001 μm allows for wide-range and high resolution skidless measurement. In addition to a flat surface, the roughness or waviness on an undulating surface such as a stepped or round surface can be evaluated with one trace.
SURFCOM TOUCH 50 has skid less measurement with a high-performance pickup while having high resolution and with a wide measuring range. Various types of workpieces can be measured by changing the stylus for deep, long, or small holes or a round surface.
Z direction ±500 µmX direction 50 mmEvaluation Length 0.1 to 50 mmStraightness accuracy 0.3 µm/50 mmDetector vertical movement volume 50 mmMeasurement Speed 0.15, 0.3, 0.6, 1.5, 3 / 0.05, 0.1, 0.2, 0.5, 1 mm/s (Switching)Pickup Sensing type Differential inductanceMeasurement Method Skid less/Skid (optional)Z direction resolution 0.0001 µm/±40 µm, 0.00125 µm/±500 µmMeasurement force 0.75 mNStylus Radius rtip = 2 µmStylus Angle 60°coneStylus Material DiamondCalculation Standards Comply with JIS2013/2001, JIS1994, JIS1982, ISO1997/2009, ISO13565, DIN1990, ASME2002/2009, ASME1995, CNOMOParameter - Profile Curve Pa, Pq, Pp, Pv, Pc, PSm, P?q, PPc, Psk, Pku, Pt, Pmr(c), Pmr, Pdc, Rz82, TILTA, AVH, Hmax, Hmin, AREA, Rmax, Rz, Sm, ?a, ?q, ?a, ?q, Lr, Rsk, Rku, Rk, Rpk, Rvk, Mr1, Mr2, Vo, K, tp, tp2, HpParameter - Roughness Curve Ra, Rq, Rz, Rv, Rc, Rt, RSm, R?q, Rsk, Rku, Rmr(c), Rmr, Rdc, Rz94, R3z, R?a, R?a, R?q, Ry, Lr, Sm, S, tp, tp2, PC, RPc JIS, RPc ISO, RPc EN, Pc, PPI, Rp, Rmax, Rz.I, RS, Rmr2, Mr1, Mr2, Rpk, Rvk, Rk, Vo, K, A1, A2, Rpm, ?a, ?q, HtpParameter - Waviness Profile Curve Wa, Wq, Wt, Wp, Wv, WSm, WPc, Wsk, Wmr(c), Wmr, Wdc, Wz, Wc, Wku, W?q, WEM, WEA, WE-a, WE-q, WE-p, WE-v, WE-Sm, WEC-q, WEC-m, WEC-p, WEC-v, WEC-SmParameter - Motif R, Rx, AR, W, Wx, AW, Rke, Rpke, Rvke, NCRX, NR, CPM, SR, SAR, Wte, NW, SAW, SW, Mr1e, Mr2e, Vo, KEvaluation Curve Profile Curve, Roughness Curve, Filtered Waviness Curve, Waviness Profile Curve, ISO13565 Special Roughness Curve, Roughness motif curve, Waviness motif curve, Upper envelope waviness curve, Rolling Circle Waviness CurveCharacteristics graph Abbot curve, Amplitude density function, Power graphFilter type Gaussian, 2RC (phase compensation), 2RC (non-phase compensation)Cutoff value - ?c 0.08, 0.25, 0.8, 2.5, 8, 25 mmCutoff value - ?s None, 2.5, 8, 25 µmDisplay 7-inch color liquid crystal touch panelData output USB connectors for USB memory, Micro USB connector for USB communicationHandySurf+ is a simple solution to measure, evaluate and document surface roughness – from incoming goods to production all the way to final inspection. With a sleek design, 2.4 inch color LCD screen, and improved user interface for intuitive operations, HANDYSURF+ offers a simple quality assurance option for measuring surface parameters throughout production. It is an ideal solution for the automotive, mechanical engineering and medical technology industries.
SURFCOM TOUCH 50 system come with an intuitive and easy-to-use screen for condition setting, calibration, measurement and analysis. An amplifier with a 7-inch wide touch panel and a new interface provides higher operability. Easy-to-use operation eliminates the need of instructions. The high performance pickup with an extended measurement range from 800 to 1,000 μm and a Z-axis minimum resolution of 0.0001 μm allows for wide-range and high resolution skidless measurement. In addition to a flat surface, the roughness or waviness on an undulating surface such as a stepped or round surface can be evaluated with one trace.
SURFCOM TOUCH 50 has skid less measurement with a high-performance pickup while having high resolution and with a wide measuring range. Various types of workpieces can be measured by changing the stylus for deep, long, or small holes or a round surface.
HandySurf+ is a simple solution to measure, evaluate and document surface roughness – from incoming goods to production all the way to final inspection. With a sleek design, 2.4 inch color LCD screen, and improved user interface for intuitive operations, HANDYSURF+ offers a simple quality assurance option for measuring surface parameters throughout production. It is an ideal solution for the automotive, mechanical engineering and medical technology industries.
The contour measuring instruments from ZEISS feature a linear drive in the X axis. Compared to the standard spindle drive, significantly higher travel speeds are possible with this magnetic linear drive. Noise from the spindle or spindle eccentricity are avoided.
Contour Tracer 1600G is a flexible CNC measuring station for contour measurements. The instrument is designed to measure any intricate profile in a 2 dimensional format. The measured profile can be post-processed in the advanced ACCTee software to analyze the profile and extract dimensional details.
Key features
Auto Element Judgment (AI Function)
The 1600D automatically determines the type of element (poin tline
circle).
Dimension Display Function
The actual measured values for parameters and geometric deviation
can be displayed on the diagram.
Profile Synthesis Function (merging of several different profiles)
The limitations on the analysis range due to the angle of the stylus
are addressed with the synthesis function.
Peak and Valley Function
This function enables the maximum workpiece point to be detected by
tracing with the stylus, simplifying alignment.
Calculation Point Repeat Function
Overall workpiece analysis can be executed after completing only one
pattern analysis for workpieces where certain shapes are repeated.
Workpiece Trace Function
The measuring range can be determined by tracing the workpiece
once. This is effective for measurement of minute profiles.
Easy Evaluation of Part Contour
Exact data on parts that were previously evaluated with a projector or
tool microscope can be obtained in a short period of time. The
measured results can be used as is for inspection reports.
High Efficiency Measurement
The teaching/playback function automates the entire process, from
measurement to pasting of the data into an inspection report.